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Simutest Inc 4800 Great America Parkway, Suite 408, Santa Clara. CA. USA. 95054 Tel: 408-988-4032 Fax: 408-988-4034


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Product Information : Scan Converter

The Scan Converter is low cost and versatile test pattern translation software. The Scan Converter efficiently converts STIL or WGL files, generated by EDA tools into the test programs for more than 70 models from most major ATE systems including those from Advantest, Verigy, Teradyne, and Credence.

Features Supports scan format of target ATE. Optionally, flattens source scan format into broad-side ATE patterns. Supports scan data compression of target ATE. Supports multiple waveform tables. Supports vector repeats and loops. Provides filters for eliminating artifacts contained in the STIL/WGL files from EDA tools. Benefits Low cost. Enables usage of standard ATE w/o scan hardware for scan test.